The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi–chip modules and printed circuit boards to full systems and microsystems. IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region. IDT’13 will take place in Marrakesh, Morocco. The Symposium is initiated by and in affiliation with the IEEE Test Technology Technical Council (TTTC) and the 2013 edition is organized by The Delft University of Technology and technically sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English.<br>Manuscripts describing original work on any topic from the scope of IDT are welcome. Authors are asked to submit technical papers in accordance to the author’s instructions in one of the following two conference tracks, and topics of interest include but are not limited to:<br>Design Methods and Tools<br>SOC, SIP, NOC design<br>Multiprocessor systems<br>Embedded systems<br>Analog, Mixed Signal and RF systems<br>MEMS and MOEMS systems<br>Low Voltage and Low Power syst.<br>Innovative technologies<br>Real time systems<br>Simulation, Validation & Verification<br>System Specification and Modelling<br>Formal Methods and Verification<br>System Design/Synthesis/Optimization<br>Test and Reliability<br>SOC and SIP testing<br>Multiprocessor test<br>Memory & FPGA Test & repair<br>Delay testing<br>Analog and Mixed Signal testing<br>MEMS/MOEMS testing<br>Defect and fault modeling<br>DFT, BIST and BISR<br>On–line testing / fault tolerant syst.<br>Fault Simulation, ATPG<br>Reliability failures/ modeling<br>Circuit reliability<br>Electronic system reliability<br>
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IDT
City
Marrakesh
Country
Morocco
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