<strong><span style="font–size: 10.0pt;font–family: Arial , sans–serif;color: rgb(4,51,129);">Conference Program</span></strong><b><span style="font–size: 10.0pt;font–family: Arial , sans–serif;color: rgb(4,51,129);"><br></span></b><span style="font–size: 10.0pt;font–family: Arial , sans–serif;color: rgb(4,51,129);">The conference program is organized with <strong><span style="font–family: Arial , sans–serif;">presentations/talks</span></strong> and <strong><span style="font–family: Arial , sans–serif;">poster sessions</span></strong> in parallel. Additionally, several <em><b><span style="font–family: Arial , sans–serif;">half–day technical tutorials</span></b></em> will be offered to you. The <em><b><span style="font–family: Arial , sans–serif;">conference</span></b></em> will be an excellent opportunity to promote your company′s products. <em><b><span style="font–family: Arial , sans–serif;">Usergroup Meetings</span></b></em> are an easy way to meet your customers. The schedule of events will provide plenty of <em><b><span style="font–family: Arial , sans–serif;">time to get in contact</span></b></em> with your colleagues, customers and suppliers.<br>The European apc|m Conference will be built<br>around sessions of following topics:<br>Process Level APC<br>Plasma etch and CVD<br>Sputtering, P3I, and e––beam<br>Lithography<br>Thermal, wet processing & CMP<br>Backend<br>Metrology and R2R<br>APC for legacy tools<br>Fab Level APC<br>Fab level process control methods<br>Virtual metrology<br>Yield management<br>Factory data analysis<br>IT infrastructure<br>Manufacturing Effectiveness and Productivity<br>Unit process & equipment productivity<br>Factory productivity and automation<br>Factory modeling, simulation and optimization<br>Cost optimization and end–of–life equipment issues<br>Environment and Green Manufacturing<br></span>
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apc|m
City
Rom
Country
Italy
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