International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systemsâ€â€covering the complete cycle from design verification, design– for–test, design–for–manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement. At ITC, design, test, and yield professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.<br>ITC, the cornerstone of the Test Week event, offers a wide variety of technical activities targeted at test and design theoreticians and practitioners, including: formal paper sessions, tutorials, panel sessions, case studies, a lecture series, commercial exhibits and presentations, and a host of ancillary professional meetings.<br>Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. In addition, authors are invited to submit practical, industry best practices to be included in application/lecture series sessions. Submissions simultaneously under review or accepted by another conference, symposium or journal, will be summarily rejected<br>
Abbrevation
ITC
City
SeattleWA
Country
United States
Deadline Paper
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Abstract