Topics<br>Design Methods and Tools<br>Test and Reliability<br>IP and SOC Design Yield Learning<br>Multiprocessor/Multi–core Systems IP and SOC Testing<br>Embedded systems Multiprocessor/Multi–Core Systems Test<br>DFX Memory & FPGA Test & repair<br>Analog, Mixed Signal and RF Design Delay Testing<br>High Speed Circuits Design High Speed, Analog, Mixed Signal & RF Testing<br>Design of MEMS and MOEMS MEMS/MOEMS Testing<br>Low Voltage and Low Power systems Defect and Fault Modeling<br>Innovative technologies DFT, BIST and BISR<br>Real time systems On–line Testing / Fault Tolerance<br>Simulation, Validation & Verification Fault Simulation, ATPG<br>System Specification and Modeling Reliability Failures/ Modeling<br>Formal Methods and Verification Circuit Reliability<br>System Design/Synthesis/Optimization Electronic system reliability<br>Regular Submissions<br>
Abbrevation
IDT
City
Algiers
Country
Algeria
Deadline Paper
Start Date
End Date
Abstract