Sophisticated sensors and devices based on Key Enabling Technologies ranging from nanotechnology, micro– and nanoelectronics to photonics, are presently being developed in many R&D labs worldwide for future high–performance products. 3D heterogeneous integration with CMOS–technology is the key for product implementation of those devices and for realizing complex integrated systems with significantly advanced functionalities. This integrated system approach is an essential element of the More–than–Moore Grand Challenge and is expected to create future business opportunities for European semiconductor industries.<br>PANEL DISCUSSION:<br>Airbus of Chips – Feasible European Reality or Science Fiction?“<br>TOPICS:<br>ADVANCED FUNCTIONAL MATERIALS<br>including materials such as<br>Nanowires, Nanorods, Nanodots & Nanoparticles<br>Graphene and Carbon Nanotubes<br>Electroceramic Materials<br>Organic and flexible Electronic Materials<br>Photonic Materials<br>NANOSENSORS<br>including sensor devices such as<br>Nanowire and Nanoparticle based Sensors<br>Chemical Sensors and Particle Sensors<br>Graphene & Carbon Nanotube based Devices<br>Nanophotonic Devices<br>MEMS & NEMS Devices<br>SYSTEM INTEGRATION & PACKAGING<br>including technologies such as<br>3D Heterogeneous Integration<br>TSV Technologies and TVS based Devices<br>Advanced Wafer Bonding Technologies (W2W, D2W,…)<br>3D SoC and SiP Solutions<br>RELIABILITY<br>including methods such as<br>Analytical Methods for Failure Mode Detection<br>Material Properties Characterization in nm– and µm–scale<br>Advanced Material Modelling and Simulation<br>Crack Propagation and Thermomechanics<br>Statistical Models for short, mid and long term Reliability Prediction<br>INNOVATIVE MANUFACTURING PROCESSES<br>including process technologies such as<br>Novel Manufacturing Techniques for Nanomaterials<br>New Patterning Approaches (NIL, roll–to–roll…)<br>Thin Film Deposition (ALD, ink–jet,…)<br>Back–end Equipment for 3D packaging<br>
Abbrevation
nanoFIS
City
Graz
Country
Austria
Start Date
End Date
Abstract