Topics of the conference include, but are not limited to:<br>Integrated Systems Design<br>SOC, SIP design<br>Multiprocessor systems<br>Embedded systems<br>Wireless systems<br>Network on Chip<br>Analog, Mixed Signal and RF systems<br>MEMS and MOEMS systems<br>Low Voltage and Low Power systems<br>Innovative technologies<br>Synthesis (physical, logic)<br>Simulation, Validation and Verification<br>3D integration<br>Hardware Security<br>Integrated Systems Technology<br>Nanoelectronics<br>Device modeling<br>Material characterization<br>Failure analysis<br>New components<br>Packaging<br>Process technology<br>Reliability issues<br>3D integration<br>Integrated Systems Testing<br>Defect and fault modeling<br>Analog and Mixed Signal testing<br>MEMS/MOEMS testing<br>SOC and SIP testing<br>Delay testing<br>Memory testing<br>Fault Simulation, ATPG<br>DFT, BIST and BISR<br>On–line testing and fault tolerant systems<br>ATE issues<br>Alternative test strategies<br>3D testing<br>Test and Security Issues<br>
Abbrevation
DTIS
City
Naples
Country
Italy
Deadline Paper
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End Date
Abstract