The International Design and Test Symposium is an IEEE–sponsored technical event devoted to exploring emerging challenges and novel concepts related to the design, test, automation, and reliability of electronic systems ranging from integrated circuits through multi–chip modules and printed circuit boards to full systems. IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test, and reliability in the Middle East and Africa (MEA) region. The Symposium is initiated by and in affiliation with the IEEE TTTC (Test Technology Technical Council) and the 2015 edition is organized and sponsored by JUST (Jordan University of Science & Technology) and AAU (Amman Arab University) in collaboration with JCP (Jordan Competitiveness Program). It is also technically sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English. Topics of interest include but are not limited to:<br>Topics<br>Design Methods and Tools<br>IP and SOC Design<br>Multiprocessor/Multi–core Systems<br>Embedded Systems<br>DFX<br>Analog, Mixed Signal and RF Design<br>High Speed Circuits Design<br>Design of MEMS and MOEMS<br>Low Voltage and Low Power systems<br>Innovative Technologies<br>Real Time Systems<br>Simulation, Validation & Verification<br>System Specification and Modeling<br>Formal Methods and Verification<br>System Design/Synthesis/Optimization<br>Test and Reliability<br>Yield Learning<br>IP and SOC Testing<br>Multiprocessor/Multi–Core Systems Test<br>Memory & FPGA Test & Repair<br>Delay Testing<br>High Speed, Analog, Mixed Signal & RF Testing<br>MEMS/MOEMS Testing<br>Defect and Fault Modeling<br>DFT, BIST and BISR<br>On–line Testing / Fault Tolerance<br>Fault Simulation, ATPG<br>Reliability Failures/ Modeling<br>Circuit Reliability<br>Electronic System Reliability<br>
Abbrevation
IDT
Link
City
Dead Sea
Country
Jordan
Deadline Paper
Start Date
End Date
Abstract