Topics:<br>– Analog Mixed Signal Test<br>– Automatic Test Generation<br>– Built–In Self–Test<br>– Defect–Based Test<br>– Design and Synthesis for Testability<br>– Design for Electromagnetic Compatibility<br>– Design for Reliable Embedded Software<br>– Design Verification/Validation<br>– Economics of Test<br>– Fault Analysis and Diagnosis<br>– Fault Modeling and Simulation<br>– Fault–Tolerance in HW/SW<br>– Fault–Tolerant Architectures<br>– Memory Test and Repair<br>– On–Line Testing<br>– Process Control and Measurements<br>– Radiation/EMI<br>– Hardening Techniques<br>– Software Fault–Tolerance<br>– Software On–Line Testing<br>– System–on–Chip Test<br>– Test Resource Partitioning<br>– Yield Optimization<br>– Hardware Security<br>
Abbrevation
LATS
City
Foz do Iguacu
Country
Brazil
Deadline Paper
Start Date
End Date
Abstract