Abbrevation
ITC
City
Fort Worth
Country
United States
Deadline Paper
Start Date
End Date
Abstract
International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems–covering the complete cycle from design verification and validation, test (<span class="caps">DFT</span>, <span class="caps">ATPG</span>, and BIST), diagnosis, failure analysis and back to process, yield, reliability and design improvement. At <span class="caps">ITC</span>, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.<br>