The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.<br>Scope:<br>Analog/Mixed–Signal Test<br>Automatic Test Generation<br>Board Test and Diagnosis<br>Boundary Scan Test<br>Built–In Self–Test (BIST)<br>Defect–Based Test<br>Delay and Performance Test<br>Dependability and Functional Safety<br>Design for Test (DFT)<br>Diagnosis and Silicon Debug<br>Economic of Test<br>Failure Analysis<br>Fault Modeling and Simulation<br>Fault Tolerance<br>GPU Test<br>High–Speed I/O Test<br>Low–Power IC Test<br>Memory Test and Repair<br>MEMS Test<br>Multi–/Many–core Processor Test<br>Nanotechnology Test<br>On–line Test<br>Power/Thermal/Reliability Issues in Test<br>Reconfigurable System Test<br>Reliability<br>RF Test<br>Hardware–oriented Security and Trust<br>Self–Repair<br>Sensor Test<br>SiP, Stacked, 3D IC Test<br>SoC Test<br>Standards in Test<br>Statistical Learning in Test<br>Test Compression<br>Test Quality<br>Test Synthesis<br>Validation and Verification<br>Yield Analysis and Enhancement<br>
Abbrevation
ATS
City
Taipei
Country
Taiwan
Deadline Paper
Start Date
End Date
Abstract