The IEEE North Atlantic Test Workshop (NATW) provides a forum for discussions on the<br>latest issues relating to high quality, economical, and efficient test methodologies and<br>designs. In addition to the traditional topics, the 2017 edition of NATW will feature the<br>theme of vehicle electronics. Major topics can include, but are not limited to:<br>Analog, Mixed Signal & RF Testing<br>Built–In Self–Test (BIST)<br>Board and Package Level Testing<br>Delay & Performance Testing<br>Design Verification/Validation<br>Diagnosis and Debug<br>Fault Modeling/Simulation<br>FPGA & Embedded Core Testing<br>IDDQ Testing<br>DFM, Defect Analysis & Defect–Based Testing<br>Multi–Chip Module Testing<br>Memory & MEMS Testing<br>Nanotechnology Testing<br>Online Testing<br>System–on–Chip (SOC) Test & Debug<br>Test Quality/System Reliability<br>Test Resource Partitioning<br>Testing for Soft Errors/Defects<br>
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NATW
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ProvidenceRI
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United States
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