ASP–DAC 2018 is the 23rd annual international conference on VLSI design automation in Asia and South Pacific regions, one of the most<br>active regions of design and fabrication of silicon chips in the world. The conference aims at providing the Asian and South Pacific<br>CAD/DA and Design community with opportunities of presenting recent advances and with forums for future directions in technologies<br>related to Electronic Design Automation (EDA). The format of the meeting intends to cultivate and promote an instructive and productive<br>interchange of ideas among EDA researchers/developers and system/circuit/device designers. All scientists, engineers, and students who<br>are interested in theoretical and practical aspects of VLSI design and design automation are welcomed to ASP–DAC.<br>Areas of Interest:<br>Original papers in, but not limited to, the following areas are invited.<br>[1] System–Level Modeling and Design Methodology:<br>1.1. HW/SW co–design, co–simulation and co–verification<br>1.2. System–level design exploration, synthesis and optimization<br>1.3. Model– and component–based embedded system/software design<br>1.4. System–level formal verification<br>1.5. System–level modeling, simulation and validation<br>tools/methodology<br>[2] Embedded System Architecture and Design:<br>2.1. Many– and multi–core SoC architecture<br>2.2. Reconfigurable and self–adaptive SoC architecture<br>2.3. IP/platform–based SoC design<br>2.4. Domain–specific architecture<br>2.5. Dependable architecture<br>2.6. On–chip memory architecture<br>2.7. Cyber physical system<br>2.8. Storage system architecture<br>2.9. Internet of things<br>[3] On–chip Communication and Networks–on–Chip:<br>3.1. On–chip communication network<br>3.2. Networks–on–chip<br>3.3. Interface and I/O design<br>3.4. Optical and RF on–chip communication<br>[4] Embedded Software:<br>4.1. Kernel, middleware and virtual machine<br>4.2. Compiler and toolchain<br>4.3. Real–time system<br>4.4. Resource allocation for heterogeneous computing platform<br>4.5. Storage software and application<br>4.6. Human–computer interface<br>4.7. System verification and analysis<br>[5] Device/Circuit–Level Modeling, Simulation and Verification:<br>5.1. Device/circuit/interconnect modeling and analysis<br>5.2. Device/circuit–level simulation tool and methodology<br>5.3. RTL and gate–leveling modeling, simulation and verification<br>5.4. Circuit–level formal verification<br>[6] Analog, RF and Mixed Signal:<br>6.1. Analog/mixed–signal/RF synthesis<br>6.2. Analog layout, verification and simulation techniques<br>6.3. Noise analysis<br>6.4. High–frequency electromagnetic simulation of circuit<br>6.5. Mixed–signal design consideration<br>6.6. Power–aware analog circuit/system design<br>6.7. Analog/mixed–signal modeling and simulation techniques<br>6.8. CAD for memory circuits<br>[7] Power Analysis, Low Power Design, and Thermal Management:<br>7.1. Power modeling, analysis and simulation<br>7.2. Low–power design and methodology<br>7.3. Thermal aware design<br>7.4. Architectural low–power design technique<br>7.5. Energy harvesting and battery management<br>[8] Logic/High–Level Synthesis and Optimization:<br>8.1. High–level synthesis tool and methodology<br>8.2. Combinational, sequential and asynchronous logic synthesis<br>8.3. Logic synthesis and physical design technique for FPGA<br>8.4. Technology mapping<br>[9] Physical Design:<br>9.1. Floorplanning, partitioning and placement<br>9.2. Interconnect planning and synthesis<br>9.3. Placement and routing optimization<br>9.4. Clock network synthesis<br>9.5. Post layout and post–silicon optimization<br>9.6. Package/PCB/3D–IC routing<br>[10] Design for Manufacturability and Reliability:<br>10.1. Reticle enhancement, lithography–related design and optimization<br>10.2. Resilience under manufacturing variation<br>10.3. Design for manufacturability, yield, and defect tolerance<br>10.4. Reliability, aging and soft error analysis<br>10.5. Design for reliability, aging, and robustness<br>[11] Timing and Signal/Power Integrity:<br>11.1. Deterministic/statistical timing and performance analysis and<br>optimization<br>11.2. Power/ground and package modeling, analysis and optimization<br>11.3. Signal/power integrity, EM modeling and analysis<br>11.4. Extraction, TSV and package modeling<br>11.5. 2D/3D on–chip power delivery network analysis and optimization<br>[12] Test and Design for Testability:<br>12.1. ATPG, BIST and DFT<br>12.2. Fault modeling and simulation<br>12.3. System test and 3D IC test<br>12.4. Online test and fault tolerance<br>12.5. Memory test and repair<br>12.6. Analog and mixed–signal/RF test<br>[13] Security and Fault–Tolerant System:<br>13.1. Security modeling and analysis<br>13.2. Architecture, tool and methodology for secure hardware<br>13.3. Design for security and security primitive<br>13.4. Cross–layer security<br>13.5. Fault analysis, detect and tolerance<br>[14] Emerging Technology:<br>14.1. New transistor/device and process technology: spintronic,<br>phase–change, single–electron etc.<br>14.2. CAD for nanotechnology, MEMS, 3D IC, quantum computing etc.<br>[15] Emerging Application:<br>15.1. Biomedical application<br>15.2. Big data application<br>15.3. Advanced multimedia application<br>15.4. Energy–storage/smart–grid/smart–building design and optimization<br>15.5. Datacenter optimization<br>15.6. Automotive system design and optimization<br>15.7. Electromobility<br>
Abbrevation
ASP-DAC
City
Jeju Island
Country
North Korea
Deadline Paper
Start Date
End Date
Abstract