<font><font color="#404040">The IEEE Latin–American Test Symposium (LATS, previously Latin–American Test Workshop – LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault–tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 19th LATS will be invited to re–submit to IEEE Design & Test,Journal of Electronic Testing: Theory and Applications – JETTA (Springer), Journal of Low Power Electronics – JOLPE (American Scientific Publishers), and IEEE Transactions on Computer–Aided Design of Integrated Circuits and Systems (TCAD).<br></font></font>
Abbrevation
LATS
City
Sao Paulo
Country
Brazil
Deadline Paper
Start Date
End Date
Abstract