The IEEE Latin–American Test Symposium (LATS, previously Latin–American Test Workshop – LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault–tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 19th LATS will be invited to re–submit to IEEE Design & Test,Journal of Electronic Testing: Theory and Applications – JETTA (Springer), Journal of Low Power Electronics – JOLPE (American Scientific Publishers), and IEEE Transactions on Computer–Aided Design of Integrated Circuits and Systems (TCAD).<br>Topics of interest include but are not limited to<br>Analog Mixed Signal Test – Automatic Test Generation – Built–In Self–Test – Defect–Based Test – Design and Synthesis for Testability – Design for Electromagnetic Compatibility – Design for Reliable Embedded Software – Design Verification/Validation<br>– Economics of Test – Fault Analysis and Diagnosis – Fault Modeling and Simulation – Fault–Tolerance in HW/SW – Fault–Tolerant Architectures – Memory Test and Repair – On–Line Testing – Process Control and Measurements<br>– Radiation/EMI – Hardening Techniques – Software Fault–Tolerance – Software On–Line Testing – System–on–Chip Test – Test Resource Partitioning – Yield Optimization – Hardware Securit<br>
Abbrevation
LATS
City
São Paulo
Country
Brazil
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