The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. The 27th NATW will feature a tutorial on Monday on the subject of verification. In addition to traditional topics, the 27th NATW will feature a general theme of “Silicon Photonics.”<br>Major topics can include, but are not limited to:<br>Analog, Mixed Signal & RF Testing<br>Built–In Self–Test (BIST)<br>Board and Package Level Testing<br>Delay & Performance Testing<br>Design Verification/Validation<br>Diagnosis and Debug<br>Fault Modeling/Simulation<br>FPGA & Embedded Core Testing<br>IDDQ Testing<br>Machine Learning for Testing<br>DFM, Defect Analysis & Defect–Based Testing<br>Multi–Chip Module Testing<br>Memory & MEMS Testing<br>Nanotechnology Testing<br>Online Testing<br>System–on–Chip (SOC) Test & Debug<br>Test Quality/System Reliability<br>Test Resource Partitioning<br>Testing for Soft Errors/Defects<br>
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NATW
City
EssexVT
Country
United States
Deadline Paper
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