IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Chicago, Vereinigte Staaten

Abbrevation

DFT

Link

http://www.dfts.org/

City

Chicago

Country

United States

Deadline Paper

2018-05-11

Start Date

2018-10-08

End Date

2018-10-10

Abstract

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state–of–the–art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest. The topics include (but are not limited to) the following ones: 1. YIELD ANALYSIS AND MODELING Defect/fault analysis and models; statistical yield modeling; diagnosis; critical area and other metrics. 2. TESTING TECHNIQUES Built–in self–test; delay fault modeling and diagnosis; testing for analog and mixed circuits; online testing; signal and clock integrity. 3. DESIGN FOR TESTABILITY IN IC DESIGN FPGA, SoC, NoC, ASIC, low power design and microprocessors. 4. ERROR DETECTION, CORRECTION, AND RECOVERY Self–testing and self–checking solutions; error–control coding; fault masking and avoidance; recovery schemes, space/time redundancy; hw/sw techniques; architectural–specific techniques, system–level design–time or runtime strategies. 5. DEPENDABILITY ANALYSIS AND VALIDATION Fault injection techniques and frameworks; dependability and characterization. 6. REPAIR, RESTRUCTURING AND RECONFIGURATION Repairable logic; reconfigurable circuit design; DFT for on–line operation; self–healing; reliable FPGA–based systems. 7. DEFECT AND FAULT TOLERANCE Reliable circuit/system synthesis; radiation hardened and/or tolerant processes and design; design space exploration for dependable systems, transient/soft faults and errors. 8. AGING AND LIFETIME RELIABILITY Aging characterization and modeling; design and run–time reliability, thermal, and variability management and recovery. 9. DEPENDABLE APPLICATIONS AND CASE STUDIES Methodologies and case study applications to Internet of Things, automotive, railway, avionics and space, autonomous systems, industrial control, etc. 10.EMERGING TECHNOLOGIES Techniques for 2.5D/3D ICs, quantum computing architectures, memristors, spintronics, microfluidics, etc. 11.DESIGN FOR SECURITY Fault attacks, fault tolerance–based countermeasures, scan–based attacks and counter–measures, hardware trojans, security vs. reliability trade–offs, interaction between VLSI test, trust, and reliability.