<br>Topics of interest include (not limited to):<br>3D/2.5D Test<br>Adaptive Test in Practice<br>ATE/Probe Card Design<br>Advances in Boundary Scan<br>Bring Up<br>Data Driven Methods<br>Data Exchange and Infrastructure<br>Defect–Oriented Testing<br>DFM and Test Diagnosis<br>Economics of Test<br>End–to– End Data Analysis<br>Embedded BIST & DFT<br>Emerging Defect Mechanisms<br>Hardware Security and Trust<br>IoT Testing<br>Known–Good– Die testing<br>Memory Test and Repair<br>MEMS Testing<br>Mixed–Signal and Analog Test<br>New Technologies and Test<br>On–Chip Test Compression<br>Online Test<br>Pre & Post– Silicon Validation<br>Power Issues in Test<br>Protocol–aware Test<br>Reliability and Resilience<br>Scan Based Test<br>SoC/SiP/NoC Test<br>Silicon Debug<br>Jitter, High–Speed I/O & RF Test<br>Simulation and Test<br>System Test (Applications)<br>System Test (Hardware/Software)<br>Test–to– Design Feedback<br>Test Escape Analysis<br>Test Flow Optimizations<br>Test Generation and Validation<br>Test Resource Partitioning<br>Test Standards<br>Test Time Analysis and Reduction<br>Testing High Speed Optics/Photonics<br>Timing Test<br><div>Yield Analysis and Optimization</div><div><br></div>
Abbrevation
ITC India
City
Bangalore
Country
India
Deadline Paper
Start Date
End Date
Abstract