8th International Workshop on Combinatorial Testing, Xian, China

Topics of interest for full and short papers include, but are not limited to:<br>*** Combinatorial testing workflow<br>o Modeling the input space for CT<br>o Efficient algorithms to generate t&#8211;way test suites, especially involving support of constraints<br>o Determination of expected system behavior for each test case<br>o Executing CT test suites<br>o Combinatorial testing based fault localization<br>o Implementation of CT with existing testing infrastructures<br>o Handling changes in test requirements<br>*** Real&#8211;world experience in deployment of combinatorial testing<br>o Empirical studies and feedback from practical applications of CT<br>o Evaluation and return of investment metrics to assess the degree of usefulness of CT<br>o Methodology used for test space modeling and determination of interaction coverage requirements<br>o Discussion of challenges and open problems in the application of CT in industrial settings<br>*** Applicability of combinatorial testing<br>o Comparison and combination of CT with other dynamic verification methods<br>o Investigation of historical records of failures to determine the kind of CT which may have detected faults<br>o Combinatorial testing for concurrent and real&#8211;time systems<br>o CT for testing cloud computing systems and use of combinatorial methods in cloud architecture<br>o Application of CT in other domains, e&#046;g&#046; information security, study of gene regulation and other biotechnology applications, mechanical engineering, etc&#046;<br>o Combinatorial testing of variability models for software product lines<br>*** Combinatorial and complementing methods<br>o Combinatorial analysis of existing test suites<br>o Test plan reduction and completeness<br><div> o CT and coverage metrics – combining the two, and studying the relationship between them<br></div><div><br></div>