IEEE international conference on Design & Test of integrated micro & nano-Systems, Gammarth, Tunesien

Abbrevation

DTS

Link

http://dts-conf.org/

City

Gammarth

Country

Tunisia

Deadline Paper

2019-02-04

Start Date

2019-04-28

End Date

2019-05-01

Abstract

<div>DTS2019 is co–organized with the IEEE Tunisia section and technically co–sponsored by the IEEE Nanotechnology council and the IEEE Region 8. </div><div> </div><div>The event is going to be organized in Gammarth–Tunis /Tunisia on 28 April – 01 May 2019. IEEE DTS’19 will be organized by the EMC Group of METS laboratory at National Engineering School of Sfax. </div><div> </div>IEEE DTS’019 re–visits the venue which has proven to be attractive and enjoyable, with many opportunities for networking, exchange of ideas and the building of a strong sense of community. A diverse assembly of researchers, engineers and scientists will be invited to present their ideas and discuss new results, providing a unique opportunity for attendees to view a variety of interesting and innovative technologies in one location. Invited papers and tutorial talks from international experts will be presented in key topical areas. <div>IEEE DTS’019 represents a scientific and technological event dedicated to integrated electronic systems which reach the nanoscale era. The interests of the conference cover all the aspects from the design to the test of micro and nano systems. IEEE DTS is an important meeting where well known researchers from universities and companies will present the latest innovations in the field of micro and nano electronics. It will be also an opportunity for researchers to present and discuss their latest work. </div><div> </div>General Scope  Systems Design & Technology • Analog, digital, mixed, and RF circuits design • SoC, MPSoC, NoC, SIP, and NIP design • Embedded electronics and System architecture • MEMS, NEMS and MOEMS systems design • Low–power electronics and systems design • Sensory Systems Design • Wireless communication systems design • Opto–electronic System Design • Biomedical Circuit & Systems • Bio–engineering & Bio–chip design • Linear & Non–Linear Circuits • Power electronics and systems design • Hardware co–design &FPGA design • VLSI systems circuit and design • DSPs and multiprocessor systems • Embedded systems for Deep Learning • Control Systems & Mechatronics • Algorithms, methods and tools for modeling, simulation, synthesis and verification of ICs • Process technologies,CMOS, BiCMOS, GaAs • Microwave Systems &Integrated antenna • 3D integration design and analysis • ICs packaging  Systems Testing & Reliability • Analog, digital, mixed, and RF circuits testing • SoC, MPSoC, NoC, SIP, and NIP test • On–line Testing and fault Tolerance • Defect and Fault Modeling • MEMS, NEMS and MOEMS Testing • 3D testing • Delay testing • DFT, BIST and BISR • Fault Simulation, ATPG • Yield Optimization • Memory &FPGA Test and Repair • Automotive reliability and test • Reliability failures and modeling • Electronic System Reliability • Test and Security Issues • ATE issues • Alternatives test strategies  Nano Electronic Systems • Nanostructured / nanoporous Materials and devices • Nano–circuits and Nano–architectures • Nano–sensors and Actuators • Nanorobotics and Nano–manipulation • Modeling and Simulation at the Nanoscale • Carbon Nanostructures and devices • Nano–fluids • Polymer Nanotechnology • Nanoscale Materials Characterization • Sensors based on emerging devices • Renewable Energy Technologies • Smart Grid • Measurement of health risk • Aerospace and Vehicle Manufacturers  VLSI IoTDevices (IoT) • Ultra–low power VLSI design for IoT • System on Chip for IoTs • IoT Application oriented Technologies • IoT communication systems • Real–time IoT systems • RFID systems • IoT Services and Applications • IoTnodes architectures • Sensors and Actuators for IoT • Power and Energy systems design for IoT nodes • Connectivity for IoT • Computing Platforms for IoT • Data Acquisition, Storage and Management for IoT • Security and Privacy Enhancing Technologies for IoT devices • IoT System Interfaces • Reliability of IoT VLSI