The 2019 Automotive Electronics Reliability Workshop will be held at Sheraton Detroit Novi Hotel from April 30th to<br>May 2nd. Previous workshops have been providing a forum and structured environment to discuss quality and<br>reliability problems and philosophies related to all aspects of passive component, discrete semiconductor, and<br>integrated circuit design, test, analysis, fabrication, assembly, and field performance. The environment is a highly<br>interactive technical presentation and panel discussion format promoting open and frank communications within the<br>international automotive component supplier base.<br>Some areas and topics that are relevant to and presented by workshop participants previously are listed below.<br>Items in bold text are those of particular interest for this year’s workshop. Works involved in Integrated Circuits,<br>Discrete and Passive Components are welcome. Presentations and late breaking contributions relevant to today’s<br>activities and tomorrow’s ideas are also requested.<br>Q100/Q101/Q200 Revisions – Impact<br>Field Quality Performance<br>Accelerated Stresses<br>Wafer Level Reliability<br>Product Characterization<br>Board Level Simulation<br>MCM Qualification/Screen<br>Reliability Simulation<br>Emerging Challenges<br>FMEA<br>Advanced Packaging<br>Technical Issues with 40nm and Below<br>Impact of OEM Automotive Environment<br>New Failure Analysis Methodologies<br>OEM/End–Customer Requirements<br>New Test/Screen Techniques<br>Quality System/Methodology Trends<br>Reliability Monitoring Usefulness<br>Burn–In/Test Screen Elimination<br>Application Specific Qualification<br>Criteria for Using Non–Automotive Parts<br>OEM System Reliability<br>Mission Profile Standardization<br>Extended Qualification Duration<br>EOS/ESD/NTF Reduction<br>Cu Wire Reliability<br>Best Practices<br>Field Performance<br>Emerging Technology<br>Autonomous Driving<br>Driver Assist/RF/Radar<br>MEM’s<br>LED’s<br>ISO Specification/ASIL<br>EMC/Latch–Up<br>Vehicle Communications/V2V<br>Internet–of–Things (IoT) in Vehicles<br>"Zero Defects" Implementation<br>New/Suspect Failure Mechanisms<br>Known Good Die (KGD)<br>Maverick Lot/Wafer Methodology<br>Design for Test/Analy<br>
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AEC
City
Novi
Country
United States
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